Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Atomic force microscopy (AFM) has established itself as a decisive tool for probing nanoscale interactions, particularly adhesion forces and capillary phenomena. A precise understanding of these ...

Atomic Force Microscopy (AFM) has evolved into a central technique in nanotechnology, providing three-dimensional imaging and precise measurements at the atomic scale. Its ability to probe surfaces by ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Christoph Gerber, who co-invented the atomic force microscope, tells Matthew Chalmers how the AFM came about 30 years ago and why it continues to shape research at the nanoscale Nano-vision Christoph ...

Researchers at the Nano Life Science Institute (WPI-NanoLSI), Kanazawa University, report in the Journal of the American Chemical Society the use of three-dimensional atomic force microscopy (AFM) and ...

In MFM, a magnetic-coated AFM probe interacts with magnetic field gradients from the sample, causing detectable forces on the probe's cantilever. To focus on magnetic interactions, MFM is often ...