Atomic force microscopy is a powerful technique that has been widely used in materials research, nano-imaging, and bioimaging. It is a topographical metrology approach that is commonly utilized in ...

What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

AFAM operates by exciting the sample with ultrasonic waves while simultaneously probing the surface with an AFM tip. The ultrasonic waves cause the sample to vibrate, and the AFM tip detects these ...

A further development in atomic force microscopy now makes it possible to simultaneously image the height profile of nanometer-fine structures as well as the electric current and the frictional force ...

Scientists have developed a computational technique that greatly increases the resolution of atomic force microscopy, a specialized type of microscope that 'feels' the atoms at a surface. The method ...

In July 1985, three physicists—Gerd Binnig of the IBM Zurich Research Laboratory, Christoph Gerber of the University of Basel, and Calvin Quate of Stanford University—puzzled over a problem while ...

In this interview, AZoNano talks to Eduard Weichselbaumer, Senior Executive at PrimeNano, about the work they do in the Atomic Force Microscopy Field and the advances the company is making. Please ...

Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM, transforming it from a tool for imaging nanoscale features ...