Electronics design and testing were once two distinct functions where an electronic design was breadboarded and populated ...

Historically, testability is an afterthought in the design process. But heightening complexity of chip designs, and especially SoCs, forces testability (and manufacturability) to take a more central ...

The testing and verification of semiconductor chips was a prominent topic at this year’s European Test Systems (ETS) conference, especially in the area of Design-for-Test (DFT) tools and techniques.

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

With the move to advanced process technologies, concerns over device power once largely limited to specialized markets have escalated rapidly among mainstream designers. More semiconductor companies ...

Representatives of Cadence Design Systems’ (www.cadence.com) design-for-test group were on hand at the Design Automation Conference (held June 7-10 in San Diego, CA) to describe bringing timing to the ...

Until very recently, semiconductor design, verification, and test were separate domains. Those domains have since begun to merge, driven by rising demand for reliability, shorter market windows, and ...

In today’s highly competitive semiconductor industry, chip-design companies strive for competitive advantages by optimizing designs for PPA (Power, Performance, Area). Along with the functional logic, ...

Automotive integrated circuits (ICs) are the critical drivers behind modern vehicle automation, safety, and efficiency. As electronic systems in automobiles become increasingly complex, robust testing ...

Integration enables companies to prepare designs and implement robust test strategies early in the PCB assembly manufacturing process, enabling earlier defect detection, reduced costs, accelerated ...