Abstract: A growing number of scientific publications have shown during this last decade the potential of colloidal quantum dots (QDs) thin films for optical sensing, such as photonic applications, ...
Abstract: In sub-28-nm nodes, existing optical critical dimension (OCD) metrology tools are challenging to simultaneously and thoroughly meet the metrology requirements of the wafer-level ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback