Abstract: The article proposes a novel approach for in-orbit satellite antenna pattern measurement by means of a dedicated small measurement satellite (MES) that flies in Double-Cross-Helix formation.
Abstract: In semiconductor manufacturing, defect detection is pivotal for enhancing productivity and yield. This paper introduces a novel weakly supervised method, the Implicit Cross Domain Diffusion ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results